EXAFS


EXAFS (Extended X-Ray Absorption Fine Structure) - a method of using a subtle structure near the X-ray absorption threshold to determine the structure of a condensed phase. This method makes it possible to carry out tests on amorphous materials.

It is required to use radiation of high intensity and therefore is usually used with synchrotron radiation. It passes through a Bragg monochromator with variable and adjustable slope, monitor, test sample and detector ionization chamber. The absorption edge energies are determined for each of the elements. Interesting is the course of the absorption curve for energies larger than the edge, in which structured information can be encoded using the Fourier transform. In addition, the number of atoms and the distance at which the element is located is determined by the absorption edge.

Using this method you can specify the mutual distances of atoms to an accuracy of 1.5 pm.

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